Campbell 21X Manuale dell'Operatore Pagina 137

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Vedere la pagina 136
SECTION
13.
21X MEASUREMENTS
{D SLOW
MEASUREMENT
Setup
Amplifier Iniegrotion
AfD Conversion
Settling
13.1 FAST
A
SEQUENGE
The 21X malkes
voltage
measurements by
'
integrating tfie
input signal
for a fixed time and
then holding the
integrated
value
for
the
analog
to
digital
(A/0)
conversion.
The
A,/D
conversion
is made with a
14 bit
successive approximation
technique
wflich resolves
the signal voltage
to
approximately
one
part
in 15,000 of the
full
scale range
pn
a differential
measurement
(e.9.,
1/15,000 x 5V
=
333pV).
The
resolution of a
single-ende(
measurement
is
one
part
in 7500.
Integrating the
signal
removes
noise
that
could
create
an
erior
if the signal
were
sources of
nbise
is
60
Hz
from
AC
power
lines.
The slow
i
time
of 16.67 milliseconds
(1.67ms
on
{ne
5V
range)
is equal
to
one 60
Hz
cycle.
the
integration
time, the
AC noise
will
to 0.
With
ditferent software
and a
hardware
,
the slow
integration time
can be
le
to
20 ms
for countries that
have 50
Hz
There are
sdveral
situations
where
the
fast
integration
tifne of
250
microseconds
(25ps
on
the 5V
rang4)
is
preferred.
The tast integration
time
minimides
time
skew between
measuremehts
and
increases
the throughput
rate.
The current
drain on the
21X batteries
is
lower when
fast
integration
time is used.
The
fast integratipn
time should
ALWAYS be used
with the
AC
half
bridge
(lnstruction
5) when
measuring
AC
resistance
or
the
output
of an
LVDT.
An
AC
resistive
sensor
will
polarize
if a
DC
voltage is
applied,
causing
erroneous
readings
anfl sensor
decay.
The induced
voltage
in aft LVDT
decays
with
time as
current
in the
primaly
coil
shifts
from the inductor
to the
series
resistpnce;
a
long
integration time
would
result
in mogt of
the
integration taking
place
after
the
sigPal
had disappeared.
.
450
uS
250uS fost
550uS
Reset
Inteqrotor
16.67mS slow
FIGURE 13.1-1. Timing
of Single-Ended
Measurement
Before making a series
of measurements
prescribed
by an
lnput
Instruction, the
21X
makes a calibration
measurement.
The
calibration
is accomplished
by measuring two
known voltages
which are sent
through the
same amplifier circuit
that
will be used
for
the
measurements. The calibration
for a single-
ended
measurement consists
of
measuring a
voltage
which
is 4/5ths of
full scale
and
then
making a measurement
with the
input
grounded.
A ditferential
measurement
is made
once
with
the
inputs as
connected
and a second
time
with
the
inputs
reversed
(Section
13.2);
calibration for differential
measurements uses
voltages
at
r4l5ths
of full
scale.
13.2
SINGLE.ENDED
AND
DIFFERENTIAL
VOLTAGE
MEASUREMENTS
NOTE: The channel
numbering
on the 21X
panel
refers
to differential
channels.
Either
the high or
low side
of a ditferential channel
can
be
used
for
single
ended
measurements. Each
side
must be
counted
when
numbering
single-ended
channels; e.9., the
high and
low sides of
differential channel
8 are single-ended
channels
15 and 16,
respectivelY.
The timing and sequence
of a single-ended
measurement
is shown
in Figure
13.1-1. A
single-ended
measurement
is made on a single
input which is referenced
to
ground.
A single
integration is
performed
for each
measurement.
A differential measurement
measures
the
difference
in
voltage between
two
inputs. The
measurement sequence
on a differential
measurement
involves two
integrations:
First
with the high input
referenced
to the
low,
then
with the inputs
reversed
(Figure
13.2-1).
The
21X computes
the differentialvoltage
by
instantaneoUsly
sampled
and
held
for the
A/D
conversion.
The
slow
integration
time
provides
a more
noisq-free
reading
than the fast
integration tiine.
One of the
most common
13-1
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